Second Asian Test Symposium(ATS'93)

        November 16-18, 1993
        Beijing, China

Sponsored by
        IEEE COMPUTER SOCIETY
        TEST TECHNOLOGY TECHNICAL COMMITTEE
In Cooperation with
        China Computer Federation
        Institute of Computing Technology, CAS
        National Natural Science Foundation of China

COMMITTEES:

Symposium Chair:        Ben M.Y.Hsiao, IBM, USA
Program Chair:          Yinghua Min, Academia Sinica, China
etc.

PROGRAM: 

SESSION 1:  ATPG1
- A Pragmatic Test Pattern Generation System for Scan-Designed Circuits
with Logic Value Constraints, E.S.Park

etc.