IEEE Asian Test Symposium > |
7th Asian Test Symposium, ATS'98
------------------------------------------------------------------------ ATS'98 CALL FOR PAPERS The Seventh Asian Test Symposium December 2 - 4, 1998, Singapore ------------------------------------------------------------------------ Sponsored by The IEEE Computer Society Test Technology Technical Committee Computer Chapter of IEEE Singapore Section Singapore Polytechnic In Co-Operation with National University of Singapore Nanyang Technological University SCOPE The Asian Test Symposium provides an annual international forum for specialists from all over the world, especially from Asia, to present and discuss various aspects of system, board, and component testing with design, manufacturing and field considerations in mind. Topics of interest include, but are not limited to: - Automatic Test Generation/Fault Simulation - Iddq Test - Synthesis for Testability / Design for Test - Economics of Test - Built-In Self-Test/On-Line Testing - Mixed Signal Test - Fault Modelling & Diagnosis - Electron-Beam Testing - Simulation and Design Verification - Failure Analysis - Software Testing / Software Design for Test SUBMISSIONS Original technical papers on the above topics are invited. The submission should not exceed 20 double-spaced pages including figures, and should include a 50-word abstract and list of 4 to 5 keywords. Authors should include the complete address, phone/fax numbers and e-mail address, and designate a contact person and a presenter. The Program Committee also welcome proposals for panels and special topic sessions. Please submit by mail five copies of the complete manuscript by April 1, 1998 to: Mr. Weng-Yew Wong, ATS'98 Secretary EC Department, Singapore Polytechnic 500 Dover Road, Singapore 139651 Tel. +65 7721473, Fax. +65 7721974, E-mail wongwy(at)sp.ac.sg The submissions will be considered evidence that upon acceptance the author(s) will prepare the final manuscript in time for inclusion in the proceedings and will present the paper at the Symposium. SYMPOSIUM TIMETABLE Submission deadline: April 1, 1998 Notification of acceptance: June 15, 1998 Camera-ready copy: August 1, 1998 For more information, please E-mail to ats98(at)sp.ac.sg web-page : http://www.sp.ac.sg/ec1/ats98.htm. ABOUT SINGAPORE Singapore is a vibrant modern city-state of 3 million people and one of Asia's four economic dragons. Situated at the southern tip of Malaysia and in the heart of South East Asia, Singapore's geographical location has helped her become the regional centre for trade, banking, tourism and communications, with the world's busiest port and an internationally-acclaimed airport which is consistently voted the world's best. To top it all, Singapore has conference facilities that rank amongst the finest in the world. Singapore is a place where East meets West. Here you will find Chinese, Malays, Indians and Eurasians living harmoniously together. English is spoken everywhere and is the common business language of all. Singapore has a pleasant, warm climate all year round, with temperatures ranging from 28(superscript: o)C in the day to 23(superscript: o)C by night. There is a rainy season from November to January. However, showers seldom last long and they provide a cool respite. Few places on earth promise such a delight for the palate, with gourmet cuisine ranging from Chinese, Malay and Indian to Mexican, Japanese and Italian. Shopping in Singapore is also about variety, quality, value for money and excellent service. From the latest in electronics, traditional crafts, European high fashion and traditional Asian wares to computer software, you will find it all here in Singapore. Theme parks, nature reserves and beach resorts are just some of Singapore's attractions that bring visitors from around the world. Singapore's unique central position in the South East Asian region and excellent transport infrastructure also provides quick and easy access to idyllic tropical retreats in Malaysia and Indonesia. Singapore is the tourism hub for tours and cruises around the region. For more information on Singapore, please refer to the Singapore Tourist Promotion Board Web Page at http://www.asia-online.com.sg/sog/stpb.html Steering Committee Yong-Khim Swee Texas Instruments Singapore Dave Chong Tad-Weng Singapore Polytechnic Daniel Chan National University of Singapore Meng-Hwa Er Nanyang Technological University, Singapore Organising Committee General Chairs Yinghua Min ICT, Chinese Academy of Sciences min(at)mimi.cnc.ac.cn Lee-Yee Lau Singapore Polytechnic lylau(at)sp.ac.sg Program Chairs Serge Demidenko Singapore Polytechnic serge.d(at)sp.ac.sg Kiyoshi Furuya Chuo University, Japan furuya(at)ise.chuo-u.ac.jp Finance Chair Sudhir Kumar Jhajharia Singapore Polytechnic Sudhir.J(at)sp.ac.sg Publicity Chair Wilson Tan Texas Instruments Singapore tanw(at)msg.ti.com Publications Chair Hua-Swee Wang Singapore Polytechnic huaswee(at)sp.ac.sg Registration Chair Lee-Ngo Low, Cassandra Singapore Polytechnic LowLN(at)sp.ac.sg Local Arrangement Chair Teck-Bee Tan-Tay Singapore Polytechnic Bee(at)sp.ac.sg Secretary Weng-Yew Wong Singapore Polytechnic wongwy(at)sp.ac.sg Industry Liaison Jagadish C. V. DVS Technology Singapore dvsmgt(at)pacific.net.sg Ex Officio Asian Test Subcommittee Chair Kozo Kinoshita kozo(at)ap.eng.osaka-u.ac.jp International Liaison Australia/N.Zealand Liaison Tharam S. Dillon La Trobe University, Australia tharam(at)cs.latrobe.edu.au Canada Liaison Andre Ivanov University of British Columbia ivanov(at)ee.ubc.ca Europe Liaison Bernard COURTOIS TIMA Laboratory Bernard.Courtois(at)imag.fr HK/Far East Liaison Joseph Lung Advance Test Co, Hong Kong jlung(at)mba1980.hbs.edu Indonesia Liaison Harry Sudibyo S. University of Indonesia elektro(at)makara.cso.ui.ac.id Malaysia Liaison Chooi-Choo Loke Intel Technology Sdn Bhd CC_Loke(at)ccm.ipn.intel.com Halili Abd Ghani Texas Instruments Malaysia Sdn Bhd. hali(at)msg.ti.com Middle East / Gulf Countries Liaison Muhammad Khan Dhodhi Kuwait University mkhan(at)eng.kuniv.edu.kw Philippines Liaison Lito Flores Electronic Assemblies Incorporated EAI_eng(at)globe.com.ph South / Central America Liaison Marcelo Lubaszewski Federal University of Rio Grande do Sul (UFRGS), Brazil luba(at)iee.ufrgs.br South Asia Regional Liaison Syed Mahfuzul Aziz Bangladesh University of Engineering & Technology smaziz(at)eebuet.kaifnet.com Taiwan Liaison Cheng-Wen Wu National Tsing Hua University cww(at)ee.nthu.edu.tw Warren Yu Texas Instruments Taiwan wayu(at)msg.ti.com USA Liaison Vishwani D. Agrawal AT&T Bell Laboratories va(at)research.att.com Program Committee V.D. Agrawal J. Abraham A.P. Ambler R.G. Bennets M. Bushnell S.T. Chakradar T. Chen B. Cockburn C. Dislis H. Fujiwara A. Ginige A. van de Goor H. Hiraishi W. K. Huang A. Ivanov B. Kaminska H.G. Kerkhoff C. Landrault C.L. Lee Z. Li H. Ma M. Nikolaidis S.H. Ong V. Piuri S.M. Reddy M. Sami J. Savir S. Sherlekar M. Soma S.Sunter Y. Takamatsu J. Thong P. Varma X. Wen M. Wong C.W. Wu S. Xu T. Yamada V. Yarmolik M. Yoshida Tim Cheng ------------------------------------------------------------------------ ATS'98 The Seventh Asian Test Symposium December 2 - 4, 1998 Hilton International Singapore ADVANCE PROGRAM ------------------------------------------------------------------------ Plenary Sessions Chair: V.Agrawal, AT&T Bell Labs, USA Keynote Address December 3, 8.00am - 10.00am Keynote Speaker :Dr. T. W. Williams Director of Research and Development, Test Technology Synopsys, Inc. Title : The New Frontier for Testing: Nano Meter Technologies ------------------------------------------------------------------------ Session 1A : BIST I December 3, 10.30am - 12.30pm Chair: C. Landrault, LIRMM, France 1.BIST Diagnostic: Simulation Models J. Savir Ð New Jersey Institute of Technology, USA 2.Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit F. Mayer, A. Stroele - Uni of Karlsruhe, Germany 3.Test Cycle Count Reduction in a Parallel Scan BIST Environment B. Ayari - Duet Technologies, USA, P. Varma Ð Veritable, USA 4.A BIST Scheme for Asynchronous Logic V. C. Alves, F. M. G. Franca, E. P. Granja - Uni Federal do Rio de Janeiro, Brazil 5.A Methodology for Minimum Area Cellular Automata Generation P. S. Cardoso, M. Strum, J. R. de A. Amazonas, J. C. Wang - Uni de Sao Paulo, Brazil Session 1B : HIGH LEVEL SYNTHESIS December 3, 10.30am - 12.30pm Chair: B.Courtois, TIMA-INPG, France 1.A High-Level Synthesis Method for Weakly Testable Data Paths M. Inoue, T. Higashimura - NAIST, Japan, K. Noda - NEC, Japan, T. Masuzawa, H. Fiujiwara - NAIST, Japan 2.Alleviating DFT Cost Using Testability Driven HLS M. L. Flottes, R. Pires, B. Rouzeyre - LIRMM, France 3.Reliability-Oriented HW/SW Partitioning & Verification for Critical-Application Systems F. Vargas, E. Bezerra, L. Wulff, D.B. Junior Ð Catholic Uni Ð PUCRS, Brazil 4.An Efficient Procedure for Obtaining Implication Relations and Its Application to Redundancy Identification H. Ichihara - Osaka Uni, S. Kajihara - Kyushu Inst of Technology, K. Kinoshita - Osaka Uni 5.Economical Importance of the Maximum Chip Area J. Hirase - Matsushita Electric Industrial, Japan Session 1C : DELAY TESTING December 3, 10.30am - 12.30pm Chair: Eran Weis, Chip Eye Technology, Israel 1.A Probabilistic Model for Path Delay Faults C. W. Wu, C. Y. Su Ð National Tsing Hua Uni, Taiwan 2.A New Low-Cost Approach for Identifying Untestable Path Delay Faults Z. Li, Y. Min - Inst of Computing Technology, China, R. K. Brayton - Uni of California at Berkeley, USA 3.False-Path Removal Using Delay Fault Simulation M. A. Gharaybeh - Synopsys, USA, V. D. Agrawal - Bell Labs, Lucent Technologies, USA, M. L. Bushnell - Rutgers Uni, USA 4.ATPG for At-Speed Robust Path Delay Fault Testing Y. C. Hsu, S. K. Gupta - Uni of Southern California, USA 5.Delay Testing with Double Observations H. Li, Z. Li, Y. Min - Inst of Computing Technology, China Session 2A.1 : FAULT MODELLING & SIMULATION December 3, 1.30pm - 3.30pm Chair: C-L.Lee, National Chiao Tung University, Taiwan 1.On a Logical Fault Model HISGLF for Enhancing Defect Coverage J. Sang, T. Shinogi, H. Takase, T. Hayashi - Mie Uni, Japan 2.Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation H. Takahashi, K. O. Boateng, Y. Takamatsu - Ehime Uni, Japan 3.On the Determination of Threshold Voltages for CMOS Gates to Facilitate Test Pattern Generation and Fault Simulation K. J. Lee, J. J. Tang, W. Y. Duh - National Cheng-Kung Uni, Taiwan 4.Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits S. M. Aziz - Bangladesh Uni of Engineering & Technology Session 2A.2 : SOFTWARE TESTING Chair: C. Messom, Dubai Polytechnic, UAE 1.Rough-Hierarchical Testing for Safety Critical Software H. Tu, F. Wu, X. Ren - Shanghai Tiedao Uni, China 2.A Structured Testing Approach for DSP Software E. M. La Fosse - Motorola, Singapore Session 2B : CURRENT TESTING December 3, 1.30pm - 3.30pm Chair: C.V. Jagadish, DVS Technology, Singapore 1.IDDQ Testing of Submicron CMOS by Cooling V. Szekely, M. Rencz, S. Torok - Technical Uni of Budapest, Hungary, B. Courtois - TIMA Lab, France 2.IDDQ Test Methodology & Tradeoffs For Scan/Non-Scan Designs M. R. Patel, S. Pico, J. Fierro - Intel, USA 3.Design for Diagnosability of CMOS Circuit X. Wen - SynTest Technologies, USA, T. Honzawa, H. Tamamoto - Akita Uni, K. K. Saluja - Uni of Wisconsin Madison, USA, K. Kinoshita - Osaka Uni 4.IDDQ Defect Detection in Deep Submicron CMOS ICs S. Kundu - Intel, USA 5.ATE Features for IDDQ Testing M. G. Faust - Credence, USA Session 2C : TEST ENGINEERING December 3, 1.30pm - 3.30pm Chair: W.Moorhead, Teradyne, Singapore 1.A New Technique to Ensure Quality of Test Patterns P. C. Koo, S. L. Pang - Siemens Components, Singapore 2.Functional Testing of CPU Based Boards Using Bus Cycle Signature System S. R. Sabapathi - Qmax Technologies, Singapore 3.Non-Intrusive Testing of High-Speed CML Circuits V. Devdas, A. Ivanov - Uni of British Columbia, Canada 4.Testing of Line-Coupled Emissions L. Bai, W. H. Chong - EMC Test Centre, Singapore 5.Fast Window Test Method of Hysteresis Test T. Corpuz - Teradyne, Philippines 6.PC-Based Hard Disk Drive Bode-Plot Generator K. W. Choo, G. Guo - Data Storage Institute, Singapore, B. M. Chen - National Uni of Singapore Session 3A : SEQUENTIAL CIRCUIT TESTING December 3, 4.00pm - 5.30pm Chair: K. Hatayama, Hitachi, Japan 1.An Optimal Time Expansion Model Based on Combinational ATPG for RT Level Circuits T. Inoue - NAIST, Japan, T. Hosokawa - Matsushita Electric Industrial, Japan, T. Mihara, H. Fujiwara - NAIST, Japan 2.Static Test Compaction for Scan-Based Designs to Reduce Test Application Time Pomeranz, S. M. Reddy - Uni of Iowa, USA 3.A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency S. Ohtake, T. Masuzawa, H. Fujiwara - NAIST, Japan 4.Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection J. Th. Van der Linden, M. H. Konijnenburg, Ad J. van de Goor - Delft Uni of Technology, The Netherlands Session 3B : DEFECT ANALYSIS & FAULT DIAGNOSIS December 3, 4.00pm - 5.30pm Chair: M.Wong, HK Polytechnic University, Hong Kong 1.On Testing of Josephson Logic Circuits Consisting of RSFQ Dual-Rail Logic Gates T. Yamada, T. Hanashima, Y. Suemori - Meiji Uni, Japan 2.Testing for Floating Gates Defects in CMOS Circuits S. Rafiq, A. Ivanov, S. Tabatabei - Uni of British Columbia, Canada, M. Renovell - LIRMM, France 3.Advanced Test and Diagnosis for Deep Submicron ICs and Embedded Cores S. P. Athan, J. L. Kurtz, J. Cowdery - Uni of Florida, USA 4.Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths N. Yanagida - Kaminomoto, Japan, H. Takahashi, Y. Takamatsu - Ehime Uni, Japan Session 3C : BOUNDARY SCAN & INTERCONNECT TESTING December 3, 4.00pm - 5.30pm Chair: S. Yano, Kochi University of Technology, Japan 1.BIST TPG for Combinational Cluster Interconnect Testing at Board Level C. H. Chiang, S. K. Gupta - Uni of Southern California, USA 2.Fault Detection in a Tristate System Environment W. Feng, W. K. Huang, F. J. Meyer, F. Lombardi - Texas A&M Uni, USA 3.Comprehensive Interconnect BIST Methodology for Virtual Socket Interface C. Su, Y. T. Chen - National Central Uni, Taiwan 4.A DFT Methodology for High-Speed MCM Based on Boundary-Scan Techniques Y. Sameshima, T. Fukazawa - NTT, Japan Session 4A : FPGA TESTING December 4, 8.15am - 9.45am Chair: M. Jacomet, Biel School of Engineering, Switzerland 1.SRAM-Based FPGAÕs: Testing the Interconnect/Logic Interface M. Renovell, J.M. Portal - LIRMM, France, J. Figueras - Uni Politecnica de Cataluya, Spain, Y. Zorian - LogicVision, USA 2.Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA N. Itazaki, F. Matsuki, Y. Matsumoto, K. Kinoshita - Osaka U, Japan 3.A Diagnosis Method for Interconnects in SRAM Based FPGAs Y. Yu, J. Xu, W. K. Huang - Fudan Uni, China, F. Lombardi - Texas A&M Uni, USA 4.Testing and Diagnosis of Interconnect Structures in FPGAs S. J. Wang, C. N. Huang - National Chung - Hsing Uni, Taiwan Session 4B : ON-LINE TESTING & FAULT TOLERANCE December 4, 8.15am - 9.45am Chair: S.M. Azis, Bangladesh University of Engineering & Technology, Bangladesh 1.An Approach to the On-Line Testing of Operational Amplifiers J. Velasco-Medina - TIMA/INPG, France, M. Lubaszeswski - UFRGS, Brasil, M. Nicolaidis - TIMA Lab, France 2.Self-Dual Duplication for Error Detection VI. V. Saposhnikov, V. V. Saposhnikov - Railway Transportation State Uni, Russia, A. Dmitriev, M. Goessel - Uni of Potsdam, Germany 3.On-Line Error Detection Schemes for a Systolic Finite-Field Inverter Y. C. Chuang, C. W. Wu - National Tsing Hua Uni, Taiwan 4.Fault Tolerance of a Tree-Connected Multiprocessor System and Its Array-Like Layout S. Nakano, N. Kamiura, Y. Hata - Himeji Inst of Technology, Japan Session 4C : IDDQ TESTING December 4, 8.15am - 9.45am Chair: H. Tamamoto, Akita University, Japan 1.Observation Time Reduction for IDDQ Testing of Bridging Faults in Sequential Circuits Y. Higami - Osaka Uni, Japan, K. K. Saluja - Uni of Wisconsin Madison, USA, K. Kinoshita - Osaka Uni, Japan 2.An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs Md. Altaf-Ul-Amin, Z. Md. Darus - Uni Kebangsaan, Malaysia 3.Integrated Current Sensing Device for Micro IDDQ Test K. Nose, T. Sakurai - Uni of Tokyo, Japan 4.A High Speed IDDQ Sensor for Low-Voltage ICs M. Hashizume, M. Ichimiya, T. TamesadaÐU of Tokushima, Japan, Y. Miura-Tokyo Metropolitan U, Japan, K. Kinoshita - Osaka U, Japan Session 5A : MEMORY TESTING December 4, 10.15am - 12.30pm Chair: W. Tan, Texas Instruments, Singapore 1.Power Analysis of DRAMs J. Vollrath, M. Huebl, E. Stahl - Siemens AG, Germany 2.Consequences of Port Restrictions on Testing Address Decoder Faults in Two-Port Memories S. Hamdioui, A. J. van de Goor - Delft Uni of Technology, The Netherlands 3.March LA: A Test for All Linked Memory Faults J. van de Goor, G. N. Gaydadjiev - Delft Uni of Technology, The Netherlands, V. N. Yarmolik, V. G. Mikitjuk State Uni of Informatics & Radioelectronics, Belarus 4.Dynamic Power Supply Current Testing of CMOS SRAMs J. Liu - Fujitsu, USA, R. Z. Makki - Uni of North Carolina at Charlotte, USA, A. Kayssi - American Uni of Beirut, Lebanon 5.March PS(23N) Test for DRAM Pattern-Sensitive Faults V. Yarmolik, Yu. Klimets - State Uni of Informatics & Radioelectronics, Belarus, S. Demidenko - Singapore Poly, Singapore Session 5B : ANALOG & MIXED-SIGNAL TEST December 4, 10.15am - 12.30pm Chair: B Kaminska, OPMAXX, USA 1.Dynamic Test Set Generation for Analog Circuits and Systems Sam Huynh, S. Kim, M. Soma, J. Zhang - Uni of Washington, USA 2.DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity M. Wong, M. Worsman - Hong Kong Polytechnic Uni, HK 3.BISTing Switched-Current Circuits M. Renovell, F. Azais, J. C. Bodin, Y. Bertrand - LIRMM, France 4.Analog Module Metrology Using MNABST-1 P1149.4 Test Chip Y. T. Chen, C. Su - National Central Uni, Taiwan 5.A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs) F. Azais - LIRMM, France, A. Ivanov - Uni of British Columbia, Canada, M. Renovell, Y. Bertrand - LIRMM, France 6.Theory and Application of Multiple Attractor Cellular Automata For Fault Diagnosis K. Paul, A. Roy, P. K. Nandi, B. N. Roy, M. D. Purkayastha, S. Chattopadhyay, P. P. Chaudhuri - Bengal Engineering College, India Session 5C : DESIGN VERIFICATION December 4, 10.15am - 12.30pm Chair: Y. Iguchi, Yukihiro, Meiji University, Japan 1.Formal Design Techniques - Theory and Engineering Reality C. Dislis, G. Musgrave, R. B. Hughes - Abstract Design Automation, UK 2.Verification of Asynchronous Circuit with Bounded Inertial Gate Delays G. Jie, Eddie Wong - Nanyang Technological Uni, Singapore 3.Verification Pattern Generation for Core-Based Design Using Port Order Fault Model S.-W. Tung - Industrial Technology Research Institute, Taiwan, J.-Y. Jou - National Chiao Tung Uni, Taiwan 4.Application of Real-Time Temporal Logic to Design Fault Detection in Responsive Communication Protocols S. Nagano, H. Fujita, Y. Kakuda, T. Kiku 5.Design and Simulation of a RISC-Based 32-Bit Embedded On-Board Computer Z. Guo, Li He, S. Guo, D. Wong - Beijing Inst of Control Engineering, China 6.Improving Design Robustness With the Aid of Simulation and Statistical Techniques S. Mozar - Singapore Poly, Singapore, P. Hodgson - Deakin Uni, Australia Session 6A : BIST II December 4, 1.30pm - 3.30pm Chair: M. Lubaszewski, University of Porto Alegre, Brazil 1.A Ring Architecture Strategy for BIST Test Pattern Generation C. Fagot, O. Gascuel, P. Girard, C. Landrault - LIRMM, France 2.Exploiting BIST Approach For Two-Pattern Testing X. Li, Paul Cheung - Uni of Hong Kong, HK 3.Low Power Built-In Self-Test C. P. Ravikumar - Indian Institute of Technology, India, N. S. Prasad - Centre for Development of Telematics, India 4.A BIST structure to Test Delay Faults in a Scan Environment P. Girard, C. Landrault, V. Moreda, S. Pravossoudovitch, A. Virazel - LIRMM, France 5.An Examination of PRPG Selection Approaches for Large, Industrial VLSI Designs Bayraktaroglu - Uni of California at San Diego, USA, K. Udawatta - Intel, USA, A. Orailoglu - Uni of California at San Diego, USA Session 6B : SEQUENTIAL CIRCUIT TESTING December 4, 1.30pm - 3.30pm Chair: H.Fujiwara, Nara Institute of Science & Technology, Japan 1.Test Generation for Synchronous Sequential Circuits Reduce Storage Requirements Pomeranz, S. M. Reddy - Uni of Iowa, USA 2.Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits M. S. Hsiao - Rutgers Uni, USA, S. T. Chakradhar - NEC, USA 3.Vector Restoration Using Accelerated Validation and Refinement S. K. Bommu, K. B. Doreswamy, S. T. Chakradhar - NEC, USA 4.On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits R. Guo, I. Pomeranz, S. M. Reddy - Uni of Iowa, USA 5.Synthesis of Sequential Circuits with Clock Control to Improve Testability K. L. Einspar - Concordia College, USA, S. K. Mehta, S. C. Seth - Uni of Nebraska-Lincoln, USA Session 6C : TEST PROGRAM GENERATION December 4, 1.30pm - 3.30pm Chair: Q-F. Chen, Beijing Institute of Automatic Test Technology, China 1.A Test Pattern Generation Algorithm Exploiting Behavioral Information S. Chusano, F. Corno, P. Prinetto - Politecnico di Torino, Italy 2.A Diagnostic Test Generation Procedure for Combinational Circuits Based on Test Elimination Pomeranz - Uni of Iowa, USA, W. K. Fuchs - Purdue Uni, USA 3.Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST M. Karkala, N. A. Touba - Uni of Texas at Austin, USA, H.-J. Wunderlich - Uni of Stuttgart, Germany 4.Test Pattern Generation for Column Compression Multiplier P. Zheng, Z. Mao, Y. Ye and Y. Deng - Harbin Inst of Technology, China 5.Counter Random Testing S. Xu - Shanghai Uni, China Panel Discussions December 4, 4.00pm - 5.30pm Panel 1 : Title: Microsystem Testing: Challenge or Common Knowledge ? Organizer: H. Kerkhoff, MESA - University of Twente, The Netherlands Panel 2 : Title: Testing Embedded Memories: Is BIST the Ultimate Solution? Organizer: C.W. Wu, National Tsing Hua University, Taiwan Post Symposium Social Function December 4, 7.00pm - 10.00pm Optional Social function (Advanced Booking only) Asia-Pacific Brewery visit cum dinner The program includes an AV presentation on Asia Pacific Brewery and its activities. This is followed by a tour of the Brew House and then a seafood dinner at the Tiger Tavern with free flow of beer straight from the Brew House. Transportation will be provided to and from Hilton Hotel. Cost is US$30 per person. |