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6th Asian Test Symposium, ATS'97
CALL FOR PAPERS
The Sixth Asian Test Symposium (ATS'97)
November 17-19, 1997
Akita Castle Hotel, Akita, Japan
Sponsored by the IEEE Computer Society
Test Technology Technical Committee (TTTC)
In Cooperation with:
Technical Group on Fault Tolerant Systems, IEICE
Special Interest Group on Design Automation, IPS Japan
Japan Society for the Promotion of Science, 132nd Committee
(Electron and Ion Beam Science and Technology)
Mining College, Akita University
SCOPE
The Asian Test Symposium provides an international forum for engineers
and researchers from all countries of the world, especially from Asia,
to present and discuss various aspects of system, board and device
testing with design, manufacturing and field considerations in mind.
The official language of the symposium is English. Topics of interest
include, but are not limited to:
- Automatic Test Generation / Fault Simulation
- Synthesis for Testability / Design for Testability
- Built-in Self-Test / On-line Testing
- Iddq Test
- Fault Modeling & Diagnosis
- Mixed-Signal Test
- Design Verification
- Electron-Beam Testing
- Economics of Test
- Software Testing / Software Design for Testing
SUBMISSIONS
Original technical papers on the above topics are invited. These should
not exceed 20 double-spaced pages including figures, and should include
a 50-word abstract and a list of 4 to 5 keywords. Authors should include
the complete address, phone/fax numbers and e-mail address, and
designate a contact person and a presenter. The Program Committee
also welcomes proposals for panels and special topics sessions. Please
submit five copies of complete manuscript to the Program Chair by
April 15, 1997. The submission will be considered evidence that upon
acceptance the author(s) will prepare the final manuscript in time for
inclusion in the proceedings and will present the paper at the Symposium.
Prof. Teruhiko Yamada
Department of Computer Science, Meiji University
1-1-1 Higashimita, Tama-Ku, Kawasaki 214, Japan
Fax: +81-44-934-7912, Tel: +81-44-934-7452
E-mail: yamada(at)cs.meiji.ac.jp
SYMPOSIUM TIMETABLE
Submission deadline : April 15, 1997
Notification of acceptance: June 30, 1997
Camera-ready Copies: August 5, 1997
Symposium: November 17-19, 1997
ORGANIZING COMMITTEE
Symposium Chair:
Yuzo Takamatsu
Ehime University
takamatsu(at)cs.ehime-u.ac.jp
Program Chair:
Teruhiko Yamada
Meiji University
yamada(at)cs.meiji.ac.jp
Finance Chair:
Kiyoshi Furuya
Chuo University
furuya(at)ise.chuo-u.ac.jp
Publicity Chair:
Hideo Fujiwara
Nara Institute of Science and Technology
fujiwara(at)is.naist.jp
Publications Chair:
Hirome Hiraishi
Kyoto Sangyo University
hiraishi(at)cc.kyoto-su.ac.jp
Registration Chair:
Masahide Takada
NEC Corporation
mtakada(at)lsi.tmg.nec.co.jp
Local Arrangement Chair:
Hideo Tamamoto
Akita University
tamamoto(at)ie.akita-u.ac.jp
Secretary:
Hiroshi Takahashi
Ehime University
takahashi(at)cs.ehime-u.ac.jp
US Liaison:
Vishwani D. Agrawal
AT & T Bell Laboratories
va(at)research.att.com
Europe Liaison:
Bernard Courtois
INPG/TIME
courtois(at)archi.imag.fr
Ex Office:
Group Chair, Asian Activities
TTTC, IEEE Computer Society
Kozo Kinoshita
Osaka University
kozo(at)ap.eng.osaka-u.ac.jp
Program Committee:
A.P. Ambler, Brunel University, UK
S.T. Chakradhar, NEC USA, USA
P.P. Chaudhuri, Indian Institute of Technology, India
S. Demidenko, Singapore Polytechnic, Republic of Singapore
H. Fujioka, Osaka University, Japan
Y. Furukawa, Advantest Corporation, Japan
A. J. van de Goor, Delft University of Technology, The Netherlands
K. Hatayama, Hitachi, Ltd., Japan
M. Hashizume, University of Tokushima, Japan
M. Hayashi, Mie University, Japan
F. Hirose, Fujitsu Labs. Ltd., Japan
M. Ishikawa, Toshiba Corporation, Japan
H. Ito, Chiba University, Japan
A. Ivanov, University of British Columbia, Canada
K. Iwasaki, Tokyo Metropolitan University, Japan
B. Kaminska, Ecole Polytechnique de Montreal, Canada
T. Kikuno, Osaka University, Japan
Y. Koseko, Mitsubishi Electric Corporation, Japan
C.L. Lee, National Chiao Tung University, Taiwan
T. Manmoto, IBM Japan, Ltd., Japan
Y. Min, Academia Sinica, China
A. Motohara, Matsushita Elec. Industrial Co., Ltd., Japan
M. Nicolaidis, TIMA/INPG, France
I. Pomeranz, University of Iowa, USA
E. Prochaska, Fachhochschule Heilbronn, Germany
J. Rajski, Mentor Graphics Corp., USA
A. Rubio, Universitat Politecnica de Catalunya, Spain
K.K. Saluja, University of Wisconsin-Madison, USA
T. Sasao, Kyushu Institute of Technology, Japan
J. Savir, IBM Somerset, USA
S.C. Seth, University of Nebraska, USA
S.D. Sherlekar, ASIC Technologies Pvt. Ltd., India
N. Suenaga, Oki Elec. Industry Co., Ltd., Japan
N. Takagi, Nagoya University, Japan
M. Teramoto, NTT LSI Laboratories, Japan
M. Tsunoyama, Niigata Institute of Technolog, Japan
P. Varma, Crosscheck Technolgy, USA
X. Wen, Akita University, Japan
C.W. Wu, National Tsing Hua University, Taiwan
S. Xu, Shanghai University of Science and Technology, China
T. Yokohira, Okayama University, Japan
T. Yoneda, Tokyo Institute of Technology, Japan
M. Yoshida, NEC Corperation, Japan
Y. Zorian, AT&T Bell Laboratories, USA
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TECHNICAL PROGRAM
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Monday November 17th, 1997
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8:30 - 9:30 Plenary Session
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Welcome Message: Y. Takamatsu, General Chair
Keynote Address: Embedded Test & Measurement is Critical for
Deep Submicron Technology
Vinod K. Agarwal, Logic Vision, U.S.A.
Program Introduction: T. Yamada, Program Chair
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9:30 - 10:00 Coffee Break
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10:00 - 12:00 1A Test Generation I
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Chair: J. Savir - New Jersey Inst. of Technology, U.S.A.
1A.1 On the Compaction of Test Sets Produced by Genetic Optimization
I. Pomeranz, S. M. Reddy - Univ. of Iowa, U.S.A.
1A.2 On the Adders with Minimum Tests
S. Kajihara, T. Sasao - Kyushu Inst. of Technology, Japan
1A.3 Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL
T. Shinogi, T. Hayashi - Mie Univ., Japan, K. Taki - Kobe Univ., Japan
1A.4 An Algorithmic Test Generation Method for Crosstalk Faults
in Synchronous Sequential Circuits
N. Itazaki, Y. Idomoto, K. Kinoshita - Osaka Univ., Japan
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10:00 - 12:00 1B DFT I
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Chair: S. K. Jhajharia - Singapore Polytechnic, Singapore
1B.1 Guaranteeing Testability in Re-Encoding for Low Power
S. Chiusano, F. Corno, P. Prinetto, M. Rebaudengo, M. S. Reorda -
Politecnico di Torino, Italy
1B.2 Automatic Testability Analysis of Boards and MCMs at Chip Level
M. Perbost , L. Lelan - Dassault Electronique, France, C. Landrault -
LIRMM, France
1B.3 Design of C-Testable Multipliers Based on the Modified Booth Algorithm
K. O. Boateng, H. Takahashi, Y. Takamatsu - Ehime Univ., Japan
1B.4 Testability Prediction for Full Scan Sequential Circuits
Using Neural Networks
G. P. Dias - Fudan Univ., China, S. Xu, P. Waiganjo - Shanghai Univ.
of Science and Technology, China
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12:00 - 13:00 Lunch
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13:00 - 15:00 2A Test Generation II
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Chair: B. Kaminska - OPMAXX, U.S.A.
2A.1 A Genetic Algorithm for the Computation of Initialization
Sequences for Synchronous Sequential Circuits
F. Corno, P. Prinetto, M. Rebaudengo, M. S. Reorda, G. Squillero -
Politecnico di Torino, Italy
2A.2 Sequential Test Generation Based on Circuit Pseudo-Transformation
S. Ohtake, T. Inoue, H. Fujiwara - Nara Inst. of Science and Technology, Japan
2A.3 Exploiting Logic Simulation to Improve Simulation-Based Sequential ATPG
F. Corno, P. Prinetto, M. Rebaudengo, M. S. Reorda, M. Violante -
Politecnico di Torino, Italy
2A.4 TEMPLATES: A Test Generation Procedure for Synchronous
Sequential Circuits
I. Pomeranz, S. M. Reddy - Univ. of Iowa, U.S.A.
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13:00 - 15:00 2B Fault Tolerance
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Chair: N. Kanekawa - Hitachi, Japan
2B.1 Design and Implementation of Strongly Code-Disjoint CMOS
Built-In Intermediate Voltage Sensor for Totally Self-Checking Circuits
J. C. W. Pang, M. W. T. Wong, Y. S. Lee - Hong Kong Polytechnic Univ., Hong Kong
2B.2 On Fault Injection Approaches for Fault Tolerance of Feedforward
Neural Networks
T. Ito, I. Takanami - Iwate Univ., Japan
2B.3 A Concurrent Fault-Detection Scheme for FFT Processors
M.Tsunoyama - Niigata Inst. of Technology, Japan, M.Uenoyama - Uenoyama
Fuel Co., Japan, T. Kabasawa - Nagaoka College of Technology, Japan
2B.4 Code-Disjoint Circuits for Parity Codes
H. Hartje - Univ. of Potsdam, Germany, E. S. Sogomonyan - Russian Academy
of Sciences, Russia, M. Gossel - Univ. of Potsdam, Germany
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15:00 - 15:25 Coffee Break
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15:25 - 17:30 3A Special Session I
Case Studies for DFT Techniques in Japanese Industry
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Chair & Coordinator: Masaaki Yoshida - NEC, Japan
3A.1 Testability Features of R10000 Microprocessor
J. Mori - Toshiba, Japan, B. Mathew, D. Burns, Y. H. Mok - Silicon Graphics, U.S.A.
3A.2 Application of a Design for Delay Testability Approach to High Speed Logic LSIs
K. Hatayama, M. Ikeda - Hitachi, Japan, M. Takakura, S. Uchiyama -
Hitachi Engineering, Japan, Y. Sakamoto - Hitachi Information Technology, Japan
3A.3 An Effective Fault Simulation Method for Core Based LSIs
T. Yoshida, R. Shimoda, T. Mizokawa, K. Hirayama - Matsushita, Japan
3A.4 Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs
T. Ono, K. Wakui, H. Hikima, Y. Nakamura, M. Yoshida - NEC, Japan
3A.5 ATREX: Design for Testability System for Mega Gate LSIs
M. Emori, J. Kumagai, K. Itaya, T. Aikyo - Fujitsu, Japan, T. Anan, J. Niimi -
Fujitsu LSI Technology, Japan
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15:25 - 17:30 3B Test Technologies (Short presentations)
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Chair: M. Nishihara - IBM Japan, Japan
3B.1 On Energy Efficiency of VLSI Testing
C. W. Wu - National Tsing Hua Univ., Taiwan
3B.2 ProTest: A Low Cost Rapid Prototyping and Test System for ASICs and FPGAs
M. Jacomet, R. Walti, L. Winzenried, J. Perez, M. Gysel - Technical Eng. School Biel,
Switzerland
3B.3 Computing Stress Tests for Interconnect Defects
V. Dabholkar - Motorola, U.S.A., S. Chakravarty - State Univ. of New York, U.S.A.
3B.4 Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits
J. Altet, A. Rubio - Univ. Politecnica de Catalunya, Spain, H. Tamamoto -
Akita Univ., Japan
3B.5 A Test Processor Chip Implementing Multiple Seed, Multiple Polynomial
Linear Feedback Shift Register
Z. M. Darus - Univ. Kebangsaan, Malaysia, I. Ahmed - Univ. of Malaya, Malaysia,
L. Ali - Univ. Kebangsaan, Malaysia
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Tuesday November 18th, 1997
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8:30 - 10:00 4A Special Session II
Beam Testing of VLSI Circuits in Japan
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Chair: Kiyoshi Nikawa - NEC, Japan
Coordinator: Hiromu Fujioka - Osaka Univ., Japan
4A.1 Automatic EB Fault Tracing System by Successive Circuit Extraction from
VLSI CAD Layout Data
K. Miura, K. Nakata, K. Nakamae, H. Fujioka - Osaka Univ., Japan
4A.2 An Approach to Diagnose Logical Faults in Partially Observable Sequential Circuits
K. Yamazaki, T. Yamada - Meiji Univ., Japan
4A.3 Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits
N. Kuji - NTT, Japan
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8:30 - 10:00 4B Mixed-Signal Test
-------------------------------
Chair: C. W. Wu - National Tsing Hua Univ., Taiwan
4B.1 A Perturbation Based Fault Modeling and Simulation for Mixed-Signal Circuits
N. Ben-Hamida, K. Saab, D. Marche, B. Kaminska - OPMAXX, U.S.A.
4B.2 Static Testing of ADCs Using Wavelet Transforms
T. Yamaguchi - Advantest Lab., Japan
4B.3 Analog Signal Metrology for Mixed Signal ICs
C. Su, Y. R. Cheng, Y. T. Chen - National Central Univ., Taiwan, S. Tenchen -
Telecommunication Lab., Taiwan
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10:00 - 10:15 Coffee Break
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10:15 - 11:45 5A Special Session III
Novel Beam Testing Techniques in Japan
-------------------------------
Chair: Motosuke Miyoshi - Toshiba, Japan
Coordinator: Hiromu Fujioka - Osaka Univ., Japan
5A.1 A New Auto-Focus Method in Critical Dimension Measurement SEM
F. Komatsu, H. Motoki, M. Miyoshi - Toshiba, Japan
5A.2 Novel Optical Probing System for Quarter - mm VLSI Circuits
K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto - Fujitsu Labs., Japan, Y. Umehara,
J. Matsumoto - Advantest, Japan
5A.3 New Capabilities on OBIRCH Method for Fault Localization and Defect Detection
K. Nikawa -NEC, Japan, S. Inoue - TDI, Japan
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5B Decision Diagrams and Logic Optimization
10:15 - 11:45
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Chair: E. Prochaska - Fachhochschule Heilbronn, Germany
5B.1 On Acceleration of Logic Circuits Optimization Using Implication Relations
H. Ichihara, K. Kinoshita - Osaka Univ., Japan
5B.2 A Variable Reordering Method for Fast Optimization of Binary Decision Diagrams
M. B. Song, H. Chang - Soongsil Univ., Korea
5B.3 On Decomposition of Kleene TDDs
Y. Iguchi - Meiji Univ., Japan, T. Sasao, M. Matsuura - Kyushu Inst. of Technology, Japan
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11:45 - 19:00 Tour (Lunch)
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19:00 - 21:00 Banquet
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Wednesday November 19th, 1997
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8:30 - 10:00 6A FPGA Test
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Chair: S. Xu - Shanghai Univ. of Science and Technology, China
6A.1 Testing for the Programming Circuit of LUT-Based FPGAs
H. Michinishi, T. Yokohira, T. Okamoto - Okayama Univ., Japan, T. Inoue, H. Fujiwara -
Nara Inst. of Science and Technology, Japan
6A.2 A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs
W. K. Huang - Fudan Univ., China, F. J. Meyer, F. Lombardi - Texas A&M Univ., U.S.A.
6A.3 Test Pattern Generation and Test Configuration Generation Methodology
for the Logic of RAM-Based FPGA
M. Renovell, J. M. Portal - LIRMM, France, J. Figueras - Univ. Politecnica de Catalunya,
Spain, Y. Zorian - Logic Vision, U.S.A.
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8:30 - 10:00 6B Software Test
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Chair: T. Yoneda - Tokyo Inst. of Technology, Japan
6B.1 Source-to-Source Instrumentation of C Based Languages: Application to
the Memory Optimization of an Automatic Bank Check Reading System
P. B. Pereira - Matra Systemes et Information, France, L. Heutte - Univ. de Rouen,
France, J. V. Moreau - Matra Systemes et Information, France, P. Courtellemont,
Y. Lecourtier - Univ. de Rouen, France
6B.2 An Algorithm for All-Du-Path Testing Coverage of Shared Memory Parallel Programs
C. S. D. Yang, L. L. Pollock - Univ. of Delaware, U.S.A.
6B.3 Estimating the Number of Faults Using Simulator Based on Generalized
Stochastic Petri-Net Model
O. Mizuno, S. Kusumoto, T. Kikuno - Osaka Univ., Japan, Y. Takagi, K. Sakamoto -
OMRON, Japan
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10:00 - 10:30 Coffee Break
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10:30 - 12:00 7A Diagnosis
----------------------------
Chair: Y. Min - Chinese Academy of Sciences, China
7A.1 On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs
T. Inoue, S. Miyazaki, H. Fujiwara - Nara Inst. of Science and Technology, Japan
7A.2 Fault Diagnosis for Static CMOS Circuits
W. Xiaoqing, H. Tamamoto - Akita Univ., Japan, K. K. Saluja - Univ. of Wisconsin,
U.S.A., K. Kinoshita - Osaka Univ., Japan
7A.3 Fault Diagnosis of Odd-Even Sorting Networks
C. W. Hu, C. L. Lee, W. C. Wu - National Chiao Tung Univ., Taiwan, J. E. Cheng -
Chung-Hua Polytechnic Inst., Taiwan
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10:30 - 12:00 7B DFT II
-------------------------------
Chair: A. Ivanov - Univ. of British Columbia, Canada
7B.1 On The Tradeoff Between Number of Clocks and Number of Latches in Shift Registers
J. Savir - New Jersey Inst. of Technology, U.S.A.
7B.2 Test Compaction in a Parallel Access Scan Environment
S. Bhatia, P. Varma - Duet Technologies, U.S.A.
7B.3 A Partial Scan Design Method Based on n-Fold Line-Up Structures
T. Hosokawa, T. Hiraoka, M. Ohta, M. Muraoka, S. Kuninobu - Matsushita, Japan
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12:00 - 13:00 Lunch
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13:00 - 15:00 8A Delay Test
-----------------------------
Chair: C. Landrault - LIRMM, France
8A.1 On the Capability of Delay Tests to Detect Bridges and Opens
S. Chakravarty - State Univ. of New York, U.S.A.
8A.2 A Method of Generating Tests for Marginal Delays and Delay Faults
in Combinational Circuits
H. Takahashi - Ehime Univ., Japan, T. Matsunaga - NEC, Japan,
K. O. Boateng, Y. Takamatsu - Ehime Univ., Japan
8A.3 Memory Efficient ATPG for Path Delay Faults
W. Long - Tsinghua Univ., China, Z. Li - Chinese Academy of Sciences,
China, S. Yang - Tsinghua Univ., China, Y. Min- Chinese Academy of Sciences, China
8A.4 Design of Delay-Verifiable Combinational Logic by Adding Extra Inputs
X. Yu, Y. Min - Chinese Academy of Sciences, China
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13:00 - 15:00 8B BIST I
-------------------------------
Chair: K. Iwasaki - Tokyo Metropolitan Univ., Japan
8B.1 BIST Testability Enhancement Using High Level Test Synthesis
for Behavioral and Structural Designs
K. Lai - Rockwell Semiconductor Systems, U.S.A., C. A. Papachristou,
M. Baklashov - Case Western Reserve Univ., U.S.A.
8B.2 On Chip Weighted Random Patterns
J. Savir - New Jersey Inst. of Technology, U.S.A.
8B.3 Random Pattern Testable Design with Partial Circuit Duplication
H. Yokoyama, W. Xiaoqing, H. Tamamoto - Akita Univ., Japan
8B.4 Accelerated Test Points Selection Method for Scan-Based BIST
M. Nakao, K. Hatayama, I. Higashi - Hitachi, Japan
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15:00 - 15:30 Coffee Break
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15:30 - 17:30 9A Current Testing
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Chair: J. E Chen - Chung-Hua Polytechnic Inst., Taiwan
9A.1 Power Supply Current Monitoring Techniques for Testing PLLs
M. Dalmia, A. Ivanov, S. Tabatabaei - Univ. of British Columbia, Canada
9A.2 Supply Current Test for Unit-to-Unit Variations of Electrical
Characteristics in Gates
M. Hashizume, T. Kuchii, T. Tamesada - Tokushima Univ., Japan
9A.3 IDDT Testing
Y. Min, Z. Zhao, Z. Li - Chinese Academy of Sciences, China
9A.4 Built-In Current Sensor Designs Based on the Bulk-Driven Technique
K. J. Lee, T. C. Huang, M. C. Huang - National Cheng-Kung Univ., Taiwan
-------------------------------
15:30 - 17:30 9B BIST II
-------------------------------
Chair: T. Tada - Mitsubishi, Japan
9B.1 Test Length for Random Testing of Sequential Machines Application to RAMs
R. David - Lab. d'Automatique de Grenoble, France
9B.2 Built-In Self-Test for Multi-Port RAMs
Y. Wu, S. Gupta - Northern Telecom, Canada
9B.3 An Extended March Test Algorithm for Embedded Memories
G. M. Park, H. Chang - Soongsil Univ., Korea
9B.4 Low Cost BIST for EDAC Circuits
D. Badura - Silesian Univ. of Katowice, Poland, A. Hlawiczka -
Silesian Technical Univ. of Gliwice, Poland
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